Antes (Beijing) Measurement and Control Technology Co., Ltd
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Mal profilometer LD130/LD260
Mal profilometer LD130/LD260
Product details

Parameter roughness, waviness parameter, p parameter

Contour element radius, distance, angle

Probe lpD10-10-2/60

lpD10-10-500

Drivers MarSurf LD 130/MarSurf LD 260

Measurement length: 0.1-130mm/0.1-260mm

Measurement range 13mm (100mm measuring needle)

13mm (200mm measuring needle)

Force measurement (z-direction) 0.5mN to 30mN, can be set in the software

Resolution (z-direction) 0.8mm

Positioning speed 0.02mm/s up to 200mm/s

Residual error Rz0 ≤ 20mm

When vt=0.1mm/s Rq0 ≤ 1nm, typical

Roughness parameter:

Ra, Rq, Rz (Ry conforms to jls and corresponds to Rz), Rmax,RPc,Rz

(jls), Rt.Rp (Rpm complies with ASME and corresponds to Rp), Rv,R3z.

RSm, RS (corresponding to S and conforming to JIS) Rsk, Rku,Rdq,Rlp,Rdc.

R HSC . RMr*,RMr*.

Core roughness parameters:

RK,RpK,RvK,RpKx,RvKx,Mr1,Mr2,A1,A2,V0

Surface parameters,P contour:

Pa,Pq,Pt,Pp,Pv,PSm,Psk,Pku,Pdq,Plq,Pdc,P HSC,PPc.

PMr*,PMr*,PMr*,P TIR-1,P TIR-2.Rz(JIS 1962)

Surface parameters,W contour:

Wa,Wq,Wt,Wp,Wv,WSm,Wsk,Wku,Wdq,Wdc,WMr*.

WMr*,WMr*,W TIR-1,W TIR-2,Wst

Surface parameters,motif(iSO 12085):

R,AR,W,AW,Rx,Wx,Wte,Nr,Ncrx,Nw,Cpm,CR,CF,CL,

ISO 5436 surface parameters:

Pt5436 D

Parameter table:

Rz-L,Rp-L,R3-L,Rdc-L,RMr-L,

Pdc-L,PMr-L

• Large measurement range of 130/260 mm

• The contour and roughness are completed in one measurement

Ultra high measurement and movement speed save measurement time

• Innovative probe system design • Magnetic clamping allows for quick and reliable replacement of probes and synchronized recognition of MarSurf LD 130

260 mm ultra long scanning length (MarSurf LD 260) with a drop of 13 mm (100 mm measuring needle length) or 26 mm (200 mm measuring needle length) in one scan

Modular structure, easy to maintain

• Maintenance does not require complete disassembly

• Ultra high measurement and movement speed


MarSurf LD 130 / LD 260

Mal measuring instruments use leading technology to achieve excellent simultaneous contour and roughness measurements in one measurement. MarSurf UD 120, LD 130, and

MarSurf LD 260, These measurement stations combine the experience of the first generation of measuring instruments and have been deeply developed.


For detailed information or configuration communication, please call/67902835

For detailed information or configuration communication, please call/67902835
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